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 Post Posted: Fri Nov 10, 2017 10:27 pm 

Joined: Wed Apr 27, 2016 9:30 pm
Posts: 5
I'm using a ZWO ASI178MM and have tested the SDK against two machines with different architectures (armv7 vs x64). With identical software I get clear differences in the received images. Issues are:

1) Comparing short dark exposures (biases) I recover an identical intrinsic pattern, except that the pattern is exactly shifted by one pixel horizontally.

2) In the armv7 images, the very last pixel is always zero, which is much lower than the typical bias level.

3) When stacking 100 short exposures of a dark night sky, obtained in video mode, the image obtained with x64 is much smoother and not at all as noisy as the image obtained with the armv7.

Shouldn't the image data returned by the SDK be independent of architecture?

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 Post Posted: Mon Nov 13, 2017 2:08 am 

Joined: Thu Feb 09, 2017 4:58 am
Posts: 92
I need to make sure of the following:
1,Are the software and Settings used on both sides exactly the same?
2,Are they all connected to the same type of USB port? Both of them are USB2.0 or USB3.0.
3,Temperature can also make a difference in the image, so pay attention to the temperature.

The image data returned by the SDK Is independent of architecture。

If it is convenient, you can upload the problem pictures in the attachment. We can do the analysis.


ZWO Driver Engineer
Location:lon=120.6 lat=31.3
SuZhou China

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